DataRay M² Measurement Systems combine a beam profiling camera mounted on an automated translation stage to make an all-in-one M² measurement system. M², or Beam Quality Factor, characterizes the degree of imperfection in a real-world laser beam relative to a perfect TEM00 beam, and is a common acceptance criterion for laser or laser system manufacturing. These systems operate by moving the mounted beam profiler through the beam waist to perform ISO 11146 compliant measurements and are available with 50 or 200mm travel lengths, and two wavelength range options of 355 - 1150nm or 2000 - 16000nm. DataRay M² Measurement Systems are designed with an easy-to-setup USB3 system, intuitive software interface, and have a variety of accessories available separately. These measurements systems are ideal for measuring a wide range of M² on pulsed and CW lasers.
或查看各区域电话
报价工具
只需输入商品编号
Copyright 2023, 爱特蒙特光学(深圳)有限公司。— 广东省深圳市龙华工业东路利金城科技工业园3栋5楼 518109 - 粤ICP备2021068591号